RJL Micro & Analytic GmbH
Clever solutions for particle extraction

«How particles are collected from the component»

Our in-house laboratory develops innovative methods for particle extraction and cleanliness analysis.
We are specialised in pragmatic solutions customised exactly to your application.

Techniques

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

MicroEx

 

MicroStrip

 

MicroWipe

 

MicroFix

 

 

MicroEx

 

MicroStrip

 

MicroWipe

 

MicroFix

 

 

particle extraction by
rinsing and filtration

 

particle extraction
by stripping

 

particle extraction
by wiping

 

fixation of particles on a
filter membrane

 

 

 

 

 

 

 

 

 

 

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More information

 

 

 

 

 

Learn about our unique laboratory service that performs contract cleanliness analyses.  analytical services

 

 

Further products for cleanliness testing

 

  • Equipment for particle extraction  particle extraction
  • Particle analysis with SEM-EDS  SEM-EDS particle analysis
  • 3D particle sizing with microtomography  particle sizing in 3D

 

 

 

 

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Topics for beginners

 

 

 

 

 

We have compiled brief articles on the basic questions
that come up in component cleanliness testing:

 

 

 

 

  • What is residual contamination?  contamination
  • How is component cleanliness tested?  overview on test methods
  • Which norms and directives apply (ISO-16232, etc.)?  norms and test directives
  • Where does the contamination originate?  particle typing with SEM-EDS
  • How does true 3D sizing of particles work?  Micro-CT particle sizing in 3D

 

© RJL Micro & Analytic GmbH, Im Entenfang 11, 76689 Karlsdorf-Neuthard, Germany (2007-18) - Imprint - Sitemap

 

Accredited Contract Laboratory Aspex Bruker microCT Component Cleanliness Contamination Analysis E2V EDX Gunshot Residue GSR in-vivo ISO-16232 ISO-17025 ISO-4405 ISO-4406 ISO-4407 Kubtec Laser Microscopy Material Analysis Micro-CT MicroQuick Microtomography Millbrook MiniSIMS Nano-CT Nanotomography Nanophoton Oil Cleanliness Analysis Particle Analysis Particle Scanner Particle Typing PSEM Radiography Raman Microscopy Residual Dirt Analysis X-Ray Inspection Analysis SAI Scanning Electron Microscopy SEM-EDX SGX Sensortech SIMS-TOF SkyScan South Bay Technology Steel Inclusion Analysis Technical Cleanliness Time-Of-Flight VDA-19 Non-Destructive Testing